发明名称 Method of making photomask blank substrates
摘要 A photomask blank substrate is made by polishing a starting substrate to a specific flatness in a principal surface region on a top surface of the substrate so as to form a polished intermediate product, then additionally polishing the intermediate product. Substrates made in this way exhibit a good surface flatness at the time of wafer exposure. When a photomask fabricated from a blank obtained from such a substrate is held on the mask stage of a wafer exposure system with a vacuum chuck, the substrate surface undergoes minimal warping, enabling exposure patterns of small geometry to be written onto wafers to good position and linewidth accuracies.
申请公布号 US7344808(B2) 申请公布日期 2008.03.18
申请号 US20040896946 申请日期 2004.07.23
申请人 SHIN-ETSU CHEMICAL CO., LTD.;NIKON CORPORATION 发明人 NUMANAMI TSUNEO;NAKATSU MASAYUKI;MOGI MASAYUKI;HAGIWARA TSUNEYUKI;KONDO NAOTO
分类号 G03F1/00;G03F1/14;B24B7/22;G03F1/08;G03F1/50;G03F1/60;H01L21/4763 主分类号 G03F1/00
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