| 摘要 |
PROBLEM TO BE SOLVED: To provide a high frequency probe capable of detecting a high frequency signal without damaging a component on a high frequency circuit board. SOLUTION: This probe has on a dielectric substrate 101, a microstrip line 103; and a quarter wavelength resonator 104 provided at an interval with the microstrip line 103 on one end of the microstrip line 103 in the noncontact state, having a quarter wavelength of a high frequency to be measured. The quarter wavelength resonator 104 is arranged in the noncontact state, close to a microstrip line 203 of a high frequency circuit 200 to be evaluated, and a high frequency signal of the high frequency circuit is resonated and detected. COPYRIGHT: (C)2009,JPO&INPIT
|
