发明名称 ULTRASONIC INSPECTION APPARATUS
摘要 PURPOSE: To always detect the defect in a test specimen with the same accuracy by altering the gains before and after the surface echo from the test specimen is detected. CONSTITUTION: An ultrasonic inspection apparatus can be DAC controlled, radiates an ultrasonic signal to a test specimen with a pulse trigger point as a starting point, and retrieves the point where the echo reception signal from the test specimen exceeds a predetermined threshold value. The retrieval is continued while a gate generator 8 outputs a gate signal. If the echo reception signal from the specimen test exceeds the predetermined threshold value, i.e., the surface echo is detected, a DAC trigger signal is supplied to a DAC curve generator 9, which outputs a DAC control signal, and supplies it to a preamplifier 3. Thus, the output level of a video amplifier 7 becomes substantially constant without depending upon the measuring time, i.e., the depth of the test specimen.
申请公布号 JPH08145969(A) 申请公布日期 1996.06.07
申请号 JP19940283626 申请日期 1994.11.17
申请人 HITACHI CONSTR MACH CO LTD 发明人 KAJIWARA JUNICHI;NAGANO YOSHIYUKI
分类号 G01B17/00;G01N29/22;G01N29/30 主分类号 G01B17/00
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