Circuit board contact resistance probe

摘要

Measurement of the contact resistance between printed circuit patterns on a circuit board and contacts within a circuit board connector is facilitated by apparatus for gaining access to the measurement points without disruption of the electrical connections between the circuit board and the connector. The apparatus includes an electrically insulated handle to which is affixed a pair of finger probes and a pair of length-adjustable pogo probes. The finger probes engage a conductor finger on the circuit board and make electrical contact therewith. Correspondingly, the pogo probes engage a contact within the connector and make electrical contact with it. Application of a known constant current through one finger and one pogo probe and measurement of the voltage appearing between the other finger and pogo probe yields the contact resistance between the conductor finger and the connector contact without disruption of the electrical connection therebetween.