发明名称 Nonvolatile semiconductor storage device capable of correctly reading selected memory cell and read method therefor
摘要 A selected memory cell is correctly read even when a threshold value of a non-selected memory cell that shares a word line is low. When reading a memory cell MC12, a discharge transistor select circuit 47 selectively discharges a bit line BL2 connected to the memory cell MC12 and two bit lines BL0 and BL1 that are adjacent to the bit line BL2. A precharge control circuit 46 fixes to a precharge voltage a center bit line among five bit lines that include a bit line BL3 connected to the memory cell MC12 and four bit lines that are adjacent to the bit line BL3 and brings the remaining bit lines into a floating state with the precharge voltage. Thus, the potential of the bit line BL3 is prevented from being lowered as a consequence of a leak current occurring via the non-selected memory cell MC when the threshold value of the selected memory cell MC12 is high, by which the erroneous determination that the ON-state is provided is prevented from being made.
申请公布号 US6487124(B2) 申请公布日期 2002.11.26
申请号 US20010955016 申请日期 2001.09.19
申请人 SHARP KABUSHIKI KAISHA 发明人 SEMI ATSUSHI
分类号 G11C16/06;G11C16/04;G11C16/24;(IPC1-7):G11C16/06 主分类号 G11C16/06
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