| 摘要 |
PROBLEM TO BE SOLVED: To provide a circuit block testing method in an integrated circuit capable of carrying out a test in a short time. SOLUTION: The integrated circuit 11 is prepared preliminarily with voltage-frequency conversion circuits 15-17 for converting voltages of testing objective points in respective analog circuits 12-14 into alternating current signals of corresponding frequencies, and a mixing circuit 18 for mixing outputs from the respective voltage-frequency conversion circuits 15-17 to be output to a terminal 19, in an inside of the circuit 11. A test signal is imparted to each of the analog circuits 12-14 when testing, the alternating current signal output from the terminal 19 of the integrated circuit 11 is converted into a digital signal in an ADC 24, and the digital data is fast-Fourier-transformation-processed to detect a frequency component included in the alternating current signal, in a DSP 26. The qualities of the analog circuits 12-14 are determined by comparing the frequency components with a reference value, in a control part 28. COPYRIGHT: (C)2006,JPO&NCIPI
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