发明名称 |
Processing probe, processing apparatus, and method of manufacturing the processing probe |
摘要 |
A method of manufacturing a processing probe comprising a cantilever arranged in opposition to a sample, and a processing needle provided at a tip end of the cantilever to be able to contact with a surface of the sample in a state of being opposed to the sample, the processing needle being sharpened at a tip end thereof, the method comprising a selecting process of selecting a diamond small piece, which is sized to be conformed to a tip end dimension of the cantilever and has a projection, out of a plurality of diamond small pieces, a moving process of moving the selected diamond small piece onto a processing base after the selecting process, and a processing process of performing an etching processing in a manner to further sharpen the projection in an optional shape with focused beam after the moving process and mounting a base end side of the projection to the tip end of the cantilever with the use of the focused beam to fabricate a processing needle.
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申请公布号 |
US2006192114(A1) |
申请公布日期 |
2006.08.31 |
申请号 |
US20060346825 |
申请日期 |
2006.02.03 |
申请人 |
ADACHI TATSUYA;KAITO TAKASHI |
发明人 |
ADACHI TATSUYA;KAITO TAKASHI |
分类号 |
G01N23/00;G01Q70/14;G01Q70/16;G01Q80/00;G01Q90/00;H01J9/14;H01J37/30 |
主分类号 |
G01N23/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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