| 发明名称 | Sensor apparatus and image forming apparatus incorporating same | ||
| 摘要 | A sensor apparatus includes an irradiation system with a light source configured to emit linearly polarized light of a first polarization direction onto a sheet-like object, in a direction oblique to a direction orthogonal to a surface of the object, a first photodetector arranged on an optical path of light that is emitted from the irradiation system and then is reflected at the object by regular reflection, a first optical element, arranged on an optical path of light reflected by diffuse reflection from an incidence plane of the object, configured to transmit linearly polarized light of a second polarization direction that is orthogonal to the first polarization direction, a second photodetector configured to receive light that has passed through the first optical element, and a detection unit configured to detect at least one of basis weight and thickness of the object. | ||
| 申请公布号 | US9429513(B2) | 申请公布日期 | 2016.08.30 |
| 申请号 | US201414454052 | 申请日期 | 2014.08.07 |
| 申请人 | RICOH COMPANY, LTD. | 发明人 | Adachi Kazuhiko;Oba Yoshihiro;Ishii Toshihiro;Hoshi Fumikazu;Chubachi Sunao;Misaka Yoshihiro |
| 分类号 | G01J4/00;G03G15/00;G01N21/21;G01B11/06;G01G9/00;G01N21/47;G01N21/59 | 主分类号 | G01J4/00 |
| 代理机构 | Cooper & Dunham LLP | 代理人 | Cooper & Dunham LLP |
| 主权项 | 1. A sensor apparatus comprising: an irradiation system provided with a light source and configured to emit linearly polarized light of a first polarization direction onto a sheet-like object, in a direction oblique to a direction orthogonal to a surface of the object; a first photodetector arranged on an optical path of light that is emitted from the irradiation system and then is reflected at the object by regular reflection; a first optical element, arranged on an optical path of light reflected by diffuse reflection from an incidence plane of the object, configured to transmit linearly polarized light of a second polarization direction that is orthogonal to the first polarization direction; a second photodetector configured to receive the linearly polarized light transmitted through the first optical element; and a detection unit configured to determine at least one of basis weight and thickness of the object, on a basis of the linearly polarized light of the second polarization direction that is orthogonal to the first polarization direction of the light emitted by the irradiation system. | ||
| 地址 | Tokyo JP | ||