发明名称 Measurement of the thickness of layers of material by ultrasonic interferometry
摘要 The invention relates to a method for the automatic correction of the variations of efficiency of an electroacoustic transducer as a function of the frequency for improving the accuracy of a device measuring the thickness of layers of materials by ultrasonic interferometry. It is characterized in that: among the echoes generated are detected, on the one hand, a beat echo characteristic of the echo interference in the medium (1) considered and, on the other hand, an echo called pilot echo offet from the beat echo and whose amplitude is characteristic of the electroacoustic conversion factor of the transducer, the level of the pilot echo is compared with a predetermined reference (24) and a command (25) is elaborated proportional to the detected difference, as a function of this command, through a corrector means (26) situated upstream of the echo processing device (9), the amplitude of the signals representative of the beat echo and of the pilot echo is influenced uniformly, the method is repeated from the initial step.
申请公布号 US4862747(A) 申请公布日期 1989.09.05
申请号 US19870080914 申请日期 1987.08.03
申请人 M.T.W. LEADER SARL 发明人 BOUDY, PIERRE;HOUZE, MARTINE;BRUNEEL, C.;BIGOTTE, JEAN L.
分类号 G01B17/02 主分类号 G01B17/02
代理机构 代理人
主权项
地址