发明名称 Microscope calibration
摘要 A microscope calibrator probe (50) includes a handle (55), a tool head (60) connected to the handle, a viewable target (90) connected to an end of the tool head opposite the handle, and three or more position signalling devices (75a-c) disposed on the handle for tracking the probe in an image guided surgery system. The tool head includes a bend of approximately 90 degrees to provide easy placement of the viewable target on an object being viewed below a microscope. Other angles for the bend are also acceptable. A precise location of the object being viewed is determined by sensing a location the three or more position signalling devices disposed on the handle with respect to an operating room reference frame and knowing an offset between the position signalling devices and a bottom surface of the viewable target in contact with the object. Additionally, the viewable target includes a viewable aperture (95) for calibrating a line of sight of the microscope and a means for indicating a rotational sense of the viewable target. <IMAGE>
申请公布号 EP0911668(A3) 申请公布日期 1999.11.17
申请号 EP19980307430 申请日期 1998.09.14
申请人 PICKER INTERNATIONAL, INC. 发明人 MESSNER, DALE A.;SCHELLENLBERG, JOHN D.;DAYTON, PATRICK A.
分类号 A61B19/00;G02B21/00 主分类号 A61B19/00
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