发明名称 CONNECTION METHOD AND CONNECTION STRUCTURE
摘要 PROBLEM TO BE SOLVED: To secure a suitably conductive state by surely connecting substrates to each other without causing troubles such as defective conduction and breakage. SOLUTION: A plurality of bumps 41 are formed on a wiring electrode 21 on the connection end of an FPC substrate 13. A plurality of through holes 42 are formed on positions corresponding to the bumps 41 in an electrode pad 33 on the connection end of a TFT substrate 14. The connection end of the FPC substrate 13 is faced to the connection end of the TFT substrate 14, the bumps 41 are inserted into the through holes 42, and the heads of the bumps 41 are projected to the upper part of the electrode pad 33. Then the heads of the bumps 41 are irradiated with laser beams to melt and solidify the heads. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005236110(A) 申请公布日期 2005.09.02
申请号 JP20040044631 申请日期 2004.02.20
申请人 SEIKO EPSON CORP 发明人 MIYAZAKI ATSUSHI
分类号 H05K3/36;H01L21/60;H05K1/14;(IPC1-7):H05K3/36 主分类号 H05K3/36
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