发明名称 |
Method for measuring hysteresis curve and anisotropic energy of magnetic memory unit |
摘要 |
A method for measuring hysteresis curves and anisotropic energy of magnetic memory units is disclosed. It comprises gradually applying different magnetic fields to a single-layer or a multilayer magnetic structure (such as a MRAM memory unit) by extra ordinary Hall effect, and recording the variation of the Hall voltage to obtain the hysteresis curve and anisotropic energy with specific instruments, and calculating the individual anisotropic energy value of the magnetic material of the single-layer or the multilayer magnetic structure.
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申请公布号 |
US7403414(B2) |
申请公布日期 |
2008.07.22 |
申请号 |
US20060529225 |
申请日期 |
2006.09.29 |
申请人 |
NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY |
发明人 |
WU TE-HO;YE LIN-HSIU;LEE JIA-MOU;WENG MING-CHI |
分类号 |
G11C11/00 |
主分类号 |
G11C11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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