发明名称 |
MULTI-ORIENTATION SOI SUBSTRATES FOR CO-INTEGRATION OF DIFFERENT CONDUCTIVITY TYPE SEMICONDUCTOR DEVICES |
摘要 |
A method of forming a semiconductor device that includes providing a base semiconductor substrate having a first orientation crystal plane, and forming an epitaxial oxide layer on the base semiconductor substrate. The epitaxial oxide layer has the first orientation crystal plane. A first semiconductor layer having a second orientation crystal plane is then bonded to the epitaxial oxide layer. A portion of the first semiconductor layer is removed to expose a second surface of the epitaxial oxide layer. A remaining portion of the first semiconductor layer is present on the first surface of the epitaxial oxide layer; and epitaxially forming a second semiconductor layer on the second surface of the epitaxial oxide layer, wherein the second semiconductor layer has a first orientation crystal plane. |
申请公布号 |
US2016181276(A1) |
申请公布日期 |
2016.06.23 |
申请号 |
US201414579430 |
申请日期 |
2014.12.22 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
Cheng Kangguo;Doris Bruce B.;Hashemi Pouya;Khakifirooz Ali;Reznicek Alexander |
分类号 |
H01L27/12;H01L29/78;H01L29/51;H01L29/66;H01L21/283;H01L21/84 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device comprising:
a base substrate comprised of a semiconductor material having a first orientation crystal plane; an epitaxial oxide layer present directly on the base substrate and having the first orientation crystal plane; and at least one semiconductor on insulator layer (SOI) present on the epitaxial oxide layer, wherein a first semiconductor layer of the at least one SOI layer has a second orientation crystal plane that is different from the first orientation crystal plane and is present directly on a first portion of the epitaxial oxide layer having the first orientation crystal plane, the first semiconductor layer providing at least the channel region of first conductivity semiconductor device, and a second semiconductor layer of the at least one SOI layer present directly on a second portion of the epitaxial oxide layer that has the first orientation crystal plane, the second semiconductor layer provides at least the channel region of second conductivity semiconductor device. |
地址 |
Armonk NY US |