发明名称 MOS TYPE SEMICONDUCTOR DEVICE
摘要 PURPOSE:To prevent gate dielectric breakdown due to overvoltage, by mounting a protective device. CONSTITUTION:A diffusion region 2 functioning as a source or a drain is installed to a semicondctor substrate 1, and a conductive region 4 is mounted through an insulating film 3. The conductive region 4 consists of a gate portion, which thins the insulating film 3 between the region 4 and the substrate 1, and a wiring region portion. The gate portion of the conductive region 4 is arranged in such a manner that its one portion covers an upper portion of a boundary between the diffusion region and the substrate 1 while holding the region insulating film 3, and the circumference of the gate portion of the conductive region 4 is covered by means of a conductive region 5 while putting the region insulating film 3. A strong electric field is formed among the diffusion region 2 and the conductive regions, and the generation of dielectric breakdown among the regions is moderated by mounting the conductive region 5.
申请公布号 JPS556870(A) 申请公布日期 1980.01.18
申请号 JP19780079538 申请日期 1978.06.29
申请人 NIPPON ELECTRIC CO 发明人 IHAYAZAKA SHIGEKAZU
分类号 H03F1/52;H01L27/02;H01L27/06;H01L29/78;H03F1/42 主分类号 H03F1/52
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