发明名称 SEMICONDUCTOR WAFER POLISHING APPARATUS AND METHOD USING A HYDROSTATIC MEDIUM
摘要 <p>A method and apparatus for polishing semiconductor wafers in which a force applied to the wafer is uniformly distributed across a surface of the wafer during polishing using a hydrostatic or compliant material situated between the wafer and a piston. In a preferred embodiment, the hydrostatic or compliant material is an elastic solid or fluid filled bag. One or more teflon disks or teflon coated surfaces may be included between the hydrostatic or compliant material and a second compliant layer to form a bearing to allow the wafer to rotate about its central axis during polishing.</p>
申请公布号 KR100258159(B1) 申请公布日期 2000.06.01
申请号 KR19920019883 申请日期 1992.10.28
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 DAINIEL, AULUMSTEAD
分类号 B24B1/00;B24B37/30;H01L21/304;(IPC1-7):H01L21/48 主分类号 B24B1/00
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