发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING ACTIVE MATRIX SUBSTRATE AND ELECTROOPTICAL DEVICE |
摘要 |
<p>PROBLEM TO BE SOLVED: To provide a method for manufacturing a semiconductor device of a stable LDD structure in which the number of steps is simplified, and a misalignment of a gate electrode and the LDD structure is eliminated, and there is no fear of an age-based deterioration of characteristics; a method for manufacturing an active matrix substrate; and an electrooptical device. SOLUTION: The present invention comprises the steps of: forming a gate oxide film 4, a gating conductive film 202 and a resist film 203 on a polysilicon film 3; patterning the gating conductive film 202 by use of a mask 203a of this resist to form a masking conductive film 202a having the substantially same pattern as that of the mask 203a; introducing a high concentration impurity into a polysilicon film 3 by use of the mask 203a and the masking conductive film 202a; selectively removing both side parts of the masking conductive film 202a to form a smaller gate electrode than the pattern of the mask 203a; and removing the mask 203a to introduce a low concentration impurity into a polysilicon film 3 with the gate electrode as a mask.</p> |
申请公布号 |
JP2001326355(A) |
申请公布日期 |
2001.11.22 |
申请号 |
JP20000140964 |
申请日期 |
2000.05.12 |
申请人 |
SEIKO EPSON CORP;MITSUBISHI ELECTRIC CORP |
发明人 |
MURAI ICHIRO;TAKEGUCHI TORU |
分类号 |
G02F1/136;G02F1/1368;H01L21/336;H01L29/786;H04N5/66;(IPC1-7):H01L29/786 |
主分类号 |
G02F1/136 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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