发明名称 Forming a phase change memory with an ovonic threshold switch
摘要 A phase change memory may include an ovonic threshold switch formed over an ovonic memory. In one embodiment, the switch includes a chalcogenide layer that overlaps an underlying electrode. Then, edge damage, due to etching the chalcogenide layer, may be isolated to reduce leakage current.
申请公布号 US2007096090(A1) 申请公布日期 2007.05.03
申请号 US20050262246 申请日期 2005.10.28
申请人 DENNISON CHARLES H 发明人 DENNISON CHARLES H.
分类号 H01L29/18 主分类号 H01L29/18
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