发明名称 Offset amount measuring method and apparatus
摘要 An offset amount measuring method is provided with: a recording process for measurement (i) of recording information for measurement, into a recording track in the L0 layer, by a predetermined section, from a measurement reference position, and of (ii) recording the information for measurement, into a recording track in the L1 layer, by the predetermined section, from or toward a measurement correspondence position, which is associated with the measurement reference position by the pre-format address; a first detecting process of detecting a border of a first recorded area in which the information for measurement is recorded and a first unrecorded area in the first recording track, on the basis of a difference in reflectance between the first recorded area and the first unrecorded area; a second detecting process of detecting a second border position in the recording track in the L1 layer, on the basis of a difference in reflectance; and a determining process of determining the offset amount, on the basis of the detected first and second border positions. Moreover, it is also provided with a judging process of judging whether or not the determined offset amount is within tolerance with respect to the first offset amount set in advance for offset countermeasures.
申请公布号 US7548499(B2) 申请公布日期 2009.06.16
申请号 US20050301245 申请日期 2005.12.13
申请人 PIONEER CORPORATION 发明人 TAGIRI TAKAO;OSHIMA SEIRO
分类号 G11B7/00 主分类号 G11B7/00
代理机构 代理人
主权项
地址