发明名称 Semiconductor device and method of manufacturing the same
摘要 A semiconductor device includes a silicon substrate, an initial buffer layer disposed on the silicon substrate and including aluminum nitride (AlN), and a semiconductor device layer disposed on the initial buffer layer and including a semiconductor compound. There is no SiN between the initial buffer layer and the silicon substrate, and a silicon lattice of the silicon substrate directly contacts a lattice of the initial buffer layer.
申请公布号 US9401405(B2) 申请公布日期 2016.07.26
申请号 US201414264398 申请日期 2014.04.29
申请人 LG INNOTEK CO., LTD. 发明人 Jang Jung Hun
分类号 H01L29/20;H01L29/267;H01L21/02;H01L33/00;H01L33/12;H01L33/32;H01L29/778;H01L29/15 主分类号 H01L29/20
代理机构 Ked & Associates, LLP 代理人 Ked & Associates, LLP
主权项 1. A semiconductor device, comprising: a silicon substrate; an initial buffer layer provided on the silicon substrate and including aluminum nitride (AlN); a semiconductor device layer provided on the initial buffer layer and having a semiconductor compound, and a transition layer provided between the initial buffer layer and the semiconductor device layer, wherein the initial buffer layer includes an ultrathin Al film deposited on the silicon substrate, and a silicon lattice of the silicon substrate directly contacts a lattice of the initial buffer layer, and wherein the transition layer includes a plurality of AlN/AlxGa1-xN superlattice unit layers.
地址 Seoul KR