发明名称 |
Semiconductor device and method of manufacturing the same |
摘要 |
A semiconductor device includes a silicon substrate, an initial buffer layer disposed on the silicon substrate and including aluminum nitride (AlN), and a semiconductor device layer disposed on the initial buffer layer and including a semiconductor compound. There is no SiN between the initial buffer layer and the silicon substrate, and a silicon lattice of the silicon substrate directly contacts a lattice of the initial buffer layer. |
申请公布号 |
US9401405(B2) |
申请公布日期 |
2016.07.26 |
申请号 |
US201414264398 |
申请日期 |
2014.04.29 |
申请人 |
LG INNOTEK CO., LTD. |
发明人 |
Jang Jung Hun |
分类号 |
H01L29/20;H01L29/267;H01L21/02;H01L33/00;H01L33/12;H01L33/32;H01L29/778;H01L29/15 |
主分类号 |
H01L29/20 |
代理机构 |
Ked & Associates, LLP |
代理人 |
Ked & Associates, LLP |
主权项 |
1. A semiconductor device, comprising:
a silicon substrate; an initial buffer layer provided on the silicon substrate and including aluminum nitride (AlN); a semiconductor device layer provided on the initial buffer layer and having a semiconductor compound, and a transition layer provided between the initial buffer layer and the semiconductor device layer, wherein the initial buffer layer includes an ultrathin Al film deposited on the silicon substrate, and a silicon lattice of the silicon substrate directly contacts a lattice of the initial buffer layer, and wherein the transition layer includes a plurality of AlN/AlxGa1-xN superlattice unit layers. |
地址 |
Seoul KR |