发明名称 |
METHOD OF INTEGRATING LOW DIELECTRIC CONSTANT INSULATOR |
摘要 |
PROBLEM TO BE SOLVED: To provide a method for processing a dielectric film on a substrate and a method for integrating a low-k dielectric film with a metal wiring subsequently formed thereto.SOLUTION: A method includes a step of preparing a dielectric film having a value of a dielectric constant of about 4 or less, on a substrate. Then, the method further includes: performing preliminary hardening treatment on the dielectric film; forming a pattern to the dielectric film using lithography and etching treatment; removing an undesired residue from the substrate; and subjecting the dielectric film to final hardening treatment. The final hardening treatment includes a step of irradiating the substrate with ultraviolet (UV) radiation.SELECTED DRAWING: Figure 2 |
申请公布号 |
JP2016167633(A) |
申请公布日期 |
2016.09.15 |
申请号 |
JP20160102785 |
申请日期 |
2016.05.23 |
申请人 |
TOKYO ELECTRON LTD |
发明人 |
LIU JUNJUN;DOREL I TOMA;YUE HONG-YU;FAGUET JACQUES |
分类号 |
H01L21/304;H01L21/768;H01L23/522 |
主分类号 |
H01L21/304 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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