Test circuit and test method of semiconductor apparatus

摘要

A test circuit of a semiconductor apparatus may include a period signal counting block configured to count a period signal by a predetermined number of times, and enable an overflow signal. The test circuit of the semiconductor apparatus may include a clock signal counting block configured to count an internal clock signal until the overflow signal is enabled, and may output clock counting codes. The test circuit of the semiconductor apparatus may include an update register configured to receive and store the clock counting codes based on the overflow signal.

主权项

1. A test circuit of a semiconductor apparatus, comprising:
a period signal counting block configured to count a period signal by a predetermined number of times, and enable an overflow signal; a clock signal counting block configured to count an internal clock signal until the overflow signal is enabled, and output clock counting codes; and an update register configured to receive and store the clock counting codes based on the overflow signal.