发明名称 MICROWAVE INTEGRATED CIRCUIT DEVICE
摘要 PROBLEM TO BE SOLVED: To omit the final adjustment work to improve the yield by evaluating an active element in the assembling process. SOLUTION: Ports 131 and 132 for measurement are arranged on both sides of an active element 12 mounted on a circuit board 11. These ports 131 and 132 are provided with lines 201 and 202, which are connected to the active element 12, and earth conductors 211 to 214, and they are provided with probe pads 221, 222, and 231 to 234 respectively. Main lines 141 and 142 which will be connected to lines 201 and 202 in the succeeding process are formed on the outsides of ports 131 and 132 for measurement, and stubs 151 and 152 for adjustment are connected to main lines 141 and 142 respectively. A probe is selectively brought into contact with probe pads 221, 222, and 231 to 234 to measure the characteristic of the active element 12, and it is evaluated to adjust the length of stubs 151 and 152 for adjustment, and lines 201 and 202 and main lines 141 and 142 are connected by transmission lines 161 and 162 respectively in the last process.
申请公布号 JPH0936601(A) 申请公布日期 1997.02.07
申请号 JP19950182703 申请日期 1995.07.19
申请人 DENSO CORP 发明人 SAITO TOSHIYA;SASAKI KUNIHIKO;MIKAMI SHIGENOBU;UTSU YORIJI
分类号 H01P1/00;G01S7/03;H01P3/08;H01P5/02 主分类号 H01P1/00
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