发明名称 WAFER MARKING DEVICE
摘要 PURPOSE:To obtain a wafer marking device in which the roundness of a dot shape at the time of dot-marking on a wafer is improved by providing a light attenuator to be variably linked into an optical system in order to regulate output light, while the device is oscillated as a laser oscillator in the most stable area. CONSTITUTION:When a marking mode set by an input part 18 is normal, a marker controller 16 controls respective elements 2, 5, 7, 12 and 13 so as to mark dots at depths approximately 1.5 to 2.5mum on a wafer 15, and a single Q switching pulse marks a single dot. In this case, the regulation of the depth is determined manually or by a control signal from a marker controller 16 in an attenuator 12 beforehand. Further numbers of pulses A and B in a diesel mark mode and a soft mark mode are controlled by a computer, and they can be made freely variable by the software with the controller 16.
申请公布号 JPH02205281(A) 申请公布日期 1990.08.15
申请号 JP19890024854 申请日期 1989.02.03
申请人 NEC CORP 发明人 KUDOKORO YUKIO
分类号 B41J2/44;B23K26/00;B23K26/06;F02B3/06;H01S3/00;H01S3/10;H01S3/101 主分类号 B41J2/44
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