| 摘要 |
PROBLEM TO BE SOLVED: To facilitate specifying by which light projection elements on a head each of unit images for inspection is formed, by relating a density read value of the unit image for inspection in each pattern for density inspection to a corresponding address in an array of light projection elements on the basis of information from an auxiliary pattern for element specification. SOLUTION: A dot pattern Dp4 for detecting an emission quantity of light is composed of dot patterns DpR1, DpR2, DpG and DpB formed by phosphor elements. Each pattern has a pattern for density inspection and an auxiliary pattern. The pattern for density inspection includes a first-a third dot faces DF1-DF3 arranged in parallel in a sub scanning direction. The auxiliary pattern includes a color index pattern iDC, patterns iDs for sub scanning index and auxiliary patterns iDm for element specification. The auxiliary patterns iDm help to recognize information on addresses in an array of the phosphor elements via a line scanner and relate a density read value of a unit image for inspection to the corresponding address in the array of the phosphor elements. |
