发明名称 Substrate processing apparatus and substrate processing method
摘要 Substrate cleaning apparatus and method capable of preventing adhesion of particles to a substrate irrespective of being hydrophilic or hydrophobic are provided. Although a cleaning liquid ejected from a two-fluid nozzle 36 rebounds from a cup CP and scatters in the form of mist toward the center side of a wafer W, a rinsing liquid is supplied from a rinse nozzle 35 to form a water film 51 on the wafer W. Owing to the presence of the water film 51 , the surface of the wafer W is protected from adhesion of particles contained in the mist. It is possible to prevent the particles in the mist from adhering to the wafer W and also possible to prevent a bad influence on the wafer W.
申请公布号 US7364626(B2) 申请公布日期 2008.04.29
申请号 US20020285411 申请日期 2002.11.01
申请人 TOKYO ELECTRON LIMITED 发明人 HIROSE KEIZO;SEKIGUCHI KENJI
分类号 B08B3/04;H01L21/304;B08B3/02;H01L21/00 主分类号 B08B3/04
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