发明名称 |
Methods for cyclically etching a metal layer for an interconnection structure for semiconductor applications |
摘要 |
Embodiments of the present disclosure provide methods for etching a metal layer, such as a copper layer, to form an interconnection structure in semiconductor devices. In one example, a method of patterning a metal layer on a substrate includes supplying a first etching gas mixture comprising a hydro-carbon gas and a hydrogen containing gas into a processing chamber having a substrate disposed therein, the substrate having a metal layer disposed thereon, supplying a second gas mixture comprising the hydrogen containing gas to a surface of the etched metal layer disposed on the substrate, and supplying a third gas mixture comprising an inert gas into the processing chamber to sputter clean the surface of the etched metal layer. |
申请公布号 |
US9359679(B2) |
申请公布日期 |
2016.06.07 |
申请号 |
US201414505587 |
申请日期 |
2014.10.03 |
申请人 |
APPLIED MATERIALS, INC. |
发明人 |
Agarwal Sumit;Howard Bradley J. |
分类号 |
C23F17/00;C23F1/12;C23F4/04;C23F4/00;C23F1/00;C23F1/02;H01L21/3065;H01L21/3213 |
主分类号 |
C23F17/00 |
代理机构 |
Patterson & Sheridan, LLP |
代理人 |
Patterson & Sheridan, LLP |
主权项 |
1. A method of patterning a metal layer on a substrate, comprising:
(a) supplying a first etching gas mixture comprising a hydro-carbon gas and a hydrogen gas (H2) into a processing chamber having a substrate disposed therein, the substrate having a metal layer disposed thereon; (b) supplying a second gas mixture comprising the hydrogen containing gas to a surface of the etched metal layer disposed on the substrate; and (c) supplying a third gas mixture comprising Ar gas or He gas into the processing chamber to sputter clean the surface of the etched metal layer. |
地址 |
Santa Clara CA US |