发明名称 Methods for cyclically etching a metal layer for an interconnection structure for semiconductor applications
摘要 Embodiments of the present disclosure provide methods for etching a metal layer, such as a copper layer, to form an interconnection structure in semiconductor devices. In one example, a method of patterning a metal layer on a substrate includes supplying a first etching gas mixture comprising a hydro-carbon gas and a hydrogen containing gas into a processing chamber having a substrate disposed therein, the substrate having a metal layer disposed thereon, supplying a second gas mixture comprising the hydrogen containing gas to a surface of the etched metal layer disposed on the substrate, and supplying a third gas mixture comprising an inert gas into the processing chamber to sputter clean the surface of the etched metal layer.
申请公布号 US9359679(B2) 申请公布日期 2016.06.07
申请号 US201414505587 申请日期 2014.10.03
申请人 APPLIED MATERIALS, INC. 发明人 Agarwal Sumit;Howard Bradley J.
分类号 C23F17/00;C23F1/12;C23F4/04;C23F4/00;C23F1/00;C23F1/02;H01L21/3065;H01L21/3213 主分类号 C23F17/00
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A method of patterning a metal layer on a substrate, comprising: (a) supplying a first etching gas mixture comprising a hydro-carbon gas and a hydrogen gas (H2) into a processing chamber having a substrate disposed therein, the substrate having a metal layer disposed thereon; (b) supplying a second gas mixture comprising the hydrogen containing gas to a surface of the etched metal layer disposed on the substrate; and (c) supplying a third gas mixture comprising Ar gas or He gas into the processing chamber to sputter clean the surface of the etched metal layer.
地址 Santa Clara CA US