发明名称 |
PROCESS FOR CORRECTING WARPED SURFACE OF PLASTIC ENCAPSULATED SEMICONDUCTOR DEVICE |
摘要 |
A process for correcting the warped surface of a plastic encapsulated semiconductor lead frame device. The semiconductor device is placed on a transporting plate and transported to a heating device. The semiconductor device and the transporting device are clamped between a pair of heating plates and heated. Then the semiconductor device and the transporting plate are removed from the device and clamped between a pair of cooling plates and cooled. The warp is corrected to a substantially flat surface. |
申请公布号 |
KR970005713(B1) |
申请公布日期 |
1997.04.19 |
申请号 |
KR19930014810 |
申请日期 |
1993.07.31 |
申请人 |
NEC KK. |
发明人 |
NICHIKAWA, HIDEYUKI |
分类号 |
H01L21/56;H01L23/31;(IPC1-7):H01L23/48 |
主分类号 |
H01L21/56 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|