A XXRAY DIFFRACTION ANGLE MEASURING DEVICE,申请号JP19750047581-传众专利搜索

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发明名称	A XXRAY DIFFRACTION ANGLE MEASURING DEVICE
摘要	PURPOSE:To accurately obtain the diffraction angle of X-ray without any difficult installation operation on test materials.
申请公布号	JPS51123673(A)	申请公布日期	1976.10.28
申请号	JP19750047581	申请日期	1975.04.21
申请人	RIGAKU DENKI CO LTD	发明人	ONO KATSUO
分类号	G01N23/207;G01N23/20	主分类号	G01N23/207
代理机构		代理人
主权项
地址

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