发明名称 Method of making stack-capacitor for a dram cell
摘要 There is disclosed a stacked capacitor with high capacity which ensures structural stability in a DRAM cell and a method for manufacturing the same. The stacked-capacitor is of a hollow (or cylindrical) capacitor where both ends of several polysilicon layers which form a storage electrode are connected with each other. In construction, this inventive stacked-capacitor includes: a first polysilicon layer coupled to the source region so as to extend in parallel with surface of the substrate over the left and right sides of the source region; a bridge polysilicon layer, extending in the upward direction of the substrate from both ends of the first polysilicon layer; a dielectric film formed so as to contact with the surfaces of the bridge polysilicon layer, first polysilicon layer, second polysilicon layer; and a third polysilicon layer formed so as to contact with the surface of the dielectric film.
申请公布号 US5236859(A) 申请公布日期 1993.08.17
申请号 US19910804384 申请日期 1991.12.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAE, DONG-JOO;BAEK, WON-SHIK;CHOI, KYU-HYUN
分类号 H01L21/8242;H01L27/108 主分类号 H01L21/8242
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