发明名称 |
SURFACE DEFECT INSPECTION INSTRUMENT |
摘要 |
PURPOSE:To provide a surface defect inspection instrument applicable on line which enables highly accurate decision of the type and grade of a surface defect of a long-sized plate material. CONSTITUTION:The surface of a steel plate 1 is scanned optically across the width thereof with a projector 2a and the reflected light from the surface is received with a photodetector 2b. A detection signal of the device is binary coded by the level to discriminate a defect part and a sound part of a texture with a discrimination circuit 3 and binary coding signals indicating the defect part are added up at a specified length and at each width of the steel plate 1 with a histogram generation circuit 4 to generate separate histograms. A feature value is extracted from the respective histograms with a feature value extraction circuit 5 to judge the feature values comprehensively with a judging circuit 6 thereby deciding the type and the grade of a surface defect of the steel plate 1. |
申请公布号 |
JPH0749314(A) |
申请公布日期 |
1995.02.21 |
申请号 |
JP19930194995 |
申请日期 |
1993.08.05 |
申请人 |
SUMITOMO METAL IND LTD |
发明人 |
ONAKA MINORU;YOKOYAMA KOICHI;UMEDA SEIJI |
分类号 |
B23K26/00;G01N21/88;G01N21/89;G01N21/892;G01N21/93;G06T1/00;G06T7/00;(IPC1-7):G01N21/89 |
主分类号 |
B23K26/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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