WAVEFORM DISPLAY APPARATUS FOR EASILY REALIZING HIGH-DEFINITION WAVEFORM OBSERVATION

摘要

A measurement part U100 measures the imput signal, sweeping the frequency in the measuring range of a predetermined frequency band, to obtain waveshape data which are developed on a frequency axis, like spectral data obtained by a spectral analyzer. The waveshape data measured by the measurement part U100 are displayed on a display device U500, being developed on the frequency axis, i.e., being in correspondence with the measurement frequency, via a displayed data processing part U20 included in a control part U200. The control part U200 has a measurement control part U30 for controlling the measurement part U100 and an enlargement/stability display processing part U40 for controlling the displayed data processing part U20. These parts U30 and U40 are provided so that data on waveshape which is enlarged or reduced, taking a predetermined point on the frequency axis as the center of the enlargement or reduction, by an enlargement or reduction factory under the changed condition of the measurement frequency set by a condition setting part U900 may he displayed. This enlargement/stability display processing part U40 plays the role of a highly fine waveshape observation being the essence of this invention and has the function of controlling substantially the display device U500 as the control part U200.