发明名称 Continuous time-of-flight ion mass spectrometer
摘要 A continuous time-of-flight mass spectrometer having an evacuated enclosure with means for generating an electric field located in the evacuated enclosure and means for injecting a sample material into the electric field. A source of continuous ionizing radiation injects ionizing radiation into the electric field to ionize atoms or molecules of the sample material, and timing means determine the time elapsed between arrival of a secondary electron out of said ionized atoms or molecules at a first predetermined location and arrival of a sample ion out of said ionized atoms or molecules at a second predetermined location.
申请公布号 US6806467(B1) 申请公布日期 2004.10.19
申请号 US20030625935 申请日期 2003.07.24
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 FUNSTEN HERBERT O.;FELDMAN WILLIAM C.
分类号 H01J49/00;H01J49/02;H01J49/40;(IPC1-7):H01J49/00 主分类号 H01J49/00
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