发明名称 Method and apparatus for predicting transient response of a closed loop apparatus
摘要 A method for predicting transient response of a closed loop apparatus includes the steps of: (a) providing a first reference tool that relates load-free impedance response with a first design gain-phase variable; (b) providing a second reference tool that relates load-free impedance response with a second design gain-phase variable; (c) determining a combined impedance response as a function of frequency; (d) employing at least one of the first and second reference tool to establish a first design value for one of the phase variable and the design load impedance at a characteristic frequency that occurs at a peak value of the combined impedance response; (e) employing at least one of the first and second reference tool to establish a second design value for the other parameter of the phase variable and the design load impedance at the characteristic frequency; (f) establishing a transient multiplier as a function of frequency associated with the output voltage with the design load impedance for selected values of phase margin; (g) creating a third reference tool relating the transient multiplier with phase margin; (h) employing the third reference tool to establish a third design value for the transient multiplier associated with the characteristic frequency and at least one of the first design and second design value; and (i) mathematically combining at least two of the first, second and third design value with a design step current to establish transient excursion of the output voltage in response to applying the design step current.
申请公布号 US6859670(B1) 申请公布日期 2005.02.22
申请号 US20000712497 申请日期 2000.11.14
申请人 LUCENT TECHNOLOGIES INC. 发明人 GEZGIN CAHIT;YOUNG CHRIS MORROW
分类号 G05B5/01;G05B23/02;(IPC1-7):G05B13/02 主分类号 G05B5/01
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