发明名称 AUTOMATIC OPTICAL INSPECTION FOR FLAT DISPLAY PANEL AND AUTOMATIC OPTICAL INSPECTION METHOD FOR FLAT DISPLAY PANEL
摘要 An automatic optical inspecting apparatus and a method for automatically and optically inspecting a planar display panel is provided to reduce time of inspection and improve reliability of inspection by using a simple spectrum analyzing method. An automatic optical inspecting apparatus comprises an inspection pattern generating unit(210), an image signal detecting unit(220), and a data processing unit(230). The inspection pattern generating unit generates the image pattern signal for inspection. The image signal detecting unit detects the image pattern outputted in the planar display panel. The data processing unit performs the spectrum analysis of the image pattern, and decides the defects. A plurality of optical detectors(221) converts a signal generated at a flat display panel(200) into an electrical signal. The data acquired from the image signal detecting unit performs a spectrum analyzing process by being collected after transmitting to the data processing unit.
申请公布号 KR20070087407(A) 申请公布日期 2007.08.28
申请号 KR20060017783 申请日期 2006.02.23
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DONG CHIN;KIM, KYUNG SEOP;LEE, YONG EUI;LEE, YEONG BEOM;PARK, MYUNG IL
分类号 G01N21/956 主分类号 G01N21/956
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