Electronic component`s i.e. integrated circuit component, connection contact contacting unit for testing device, has pairs of contact springs with respective contact regions, and adjustable stop unit restricting spring deflection of springs

摘要

The contacting unit (10) has a number of pairs of contact springs (14, 16) with respective contact regions (20, 22). The contact springs are elastically formed and supported such that the contact regions of the contact springs are compressed against a connection contact (18) relative to the contacting unit in a test position of an electronic component (12). An adjustable stop unit (24) restricts spring deflection of the contact springs. The stop unit has a stop contour that cooperates with a starting contour (28) of the contact springs. An independent claim is also included for a method for contacting a connection contact of an electronic component with a contacting unit.