| 摘要 |
PROBLEM TO BE SOLVED: To improve testing efficiency by reducing the testing time of a semiconductor device by a built-in scan chain. SOLUTION: A cell for constituting a scan chain is classified into a group of input cells 5 and a group of output cells 6 and the input cells 5 or the output cells 6 which belong to each group within the group are connected in series. The number of bits of a data S1 inputted to a scan in terminal 3 is determined by the number of input cells (m) regardless of the number of output cells (n) and hence can be compressed from a conventional (m+n).2<n> bits to m.2<n> bits, thus reducing test time. Also, by providing switch terminals 7-16 for switching the connection order of a group of input cells 5 and a group of output cells 6, other semiconductor devices with an output signal T0 as an input signal can also be efficiently tested as well as one semiconductor device. |
