发明名称 Method for manufacturing an integrated MEMS device
摘要 An integrated MEMS device and its manufacturing method are provided. In the manufacturing method, the sacrificial layer is used to integrate the MEMS wafer and the circuit wafer. The advantage of the present invention comprises preventing films on the circuit wafer from being damaged during process. By the manufacturing method, a mechanically and thermally stable structure material, for example: monocrystalline silicon and polysilicon, can be used. The integrated MEMS device manufactured can also possess the merit of planar top-surface topography with high fill factor. The manufacturing method is especially suitable for manufacturing MEMS array device.
申请公布号 US9359193(B2) 申请公布日期 2016.06.07
申请号 US201414165752 申请日期 2014.01.28
申请人 Asia Pacific Microsystems, Inc. 发明人 Hsieh Jerwei
分类号 H01L21/4763;B81C1/00;B81B7/00 主分类号 H01L21/4763
代理机构 Kamrath IP Lawfirm, P.A. 代理人 Kamrath Alan D.;Kamrath IP Lawfirm, P.A.
主权项 1. A method for manufacturing an integrated MEMS device, comprising: (a) providing a device wafer and forming a patterned first sacrificial layer and a first structural layer on the device wafer sequentially; (b) providing a circuit wafer having at least a patterned first bonding layer thereon; (c) bonding the first bonding layer on the circuit wafer to the device wafer; (d) patterning the device wafer to form a patterned second structural layer and to expose a portion of the first sacrificial layer; and (e) removing the first sacrificial layer; wherein, between the step (a) and step (b), further comprising a step (a′): forming a patterned second bonding layer on the first structural layer; and in the step (c) further comprising a step of bonding the first bonding layer to the second bonding layer.
地址 Hsinchu TW