发明名称 VARIABLE RESISTANCE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 A variable resistance memory device includes a semiconductor substrate having a vertical transistor with a shunt gate that increases an area of a gate of the vertical transistor.
申请公布号 US2016204163(A1) 申请公布日期 2016.07.14
申请号 US201615074913 申请日期 2016.03.18
申请人 SK hynix Inc. 发明人 PARK Nam Kyun
分类号 H01L27/24;H01L29/78;H01L45/00 主分类号 H01L27/24
代理机构 代理人
主权项
地址 Gyeonggi-do KR