发明名称 MANUFACTURING OF SEMICONDUCTOR DEVICE
摘要 PURPOSE:To improve a rate of area in a Schottky diode and make a fine diode by a method wherein the first film made of substance doped with impurity material is formed on an insulation film at a circumference of diode and the impurity material in the film is dispersed on a surface of the semiconductor base board via the second film made of polycrystal silicone. CONSTITUTION:Oxide Si film 2 is formed on a surface of the base board 1, and on this film is further formed a boron.silicate.glass film 3. Then, the films 8 and 2 are selectively removed by chemical etching to form a circular opening 4. Then, on the entire surface of the base board 1 is formed a polycrystal silicon film 5 having no impurity substance doped. Heat treatment is performed to make a boron doped poly Si film 5'. Impurity boron is driven into a surface of the base board 1 through the film 5.
申请公布号 JPS5662375(A) 申请公布日期 1981.05.28
申请号 JP19790137635 申请日期 1979.10.26
申请人 HITACHI LTD 发明人 ITOU TATSU
分类号 H01L29/872;H01L29/47;H01L29/861;(IPC1-7):01L29/91 主分类号 H01L29/872
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