发明名称 METHOD AND MECHANISM FOR ADJUSTING POSITION OF SAMPLE IN OPTICAL MEASUREMENT
摘要 PURPOSE:To position easily a sample at the optimum position with high accuracy even in case of the transparent sample, by storing the optimum position of the sample in an optical apparatus once by a sample position adjusting mechanism. CONSTITUTION:Light from a visible ray source 9 reflected by a semitransparent mirror is advanced reversely optical paths 7, 7' and is condensed after passing through an analysis part 4 and a condensing part 2. A scattering reflex mirror 11 is positioned at this condensed position and the position and the direction of the mirror 11 are adjusted so that reflected light by the mirror 11 traces the paths 7, 7' and is made incident to a detector 6. Hereafter, a scattered light 12 scattered by the mirror 11 is caught by an optical apparatus 13 which is fixed at a prescribed position and is stored in the apparatus 13 by making the condensed position of the light from the source 9 on the mirror 11 as the optimum position to be positioned a sample 1. Next, the mirror 8 and 11 are moved to the position of the outside of the optical paths 7, 7' i.e. such positions as shown by 8a and 11a and hereafter, the sample 1 is adjusted and is positioned at the optimum position stored in the apparatus 13 at the time of positioning the sample 1 for the future.
申请公布号 JPS58215537(A) 申请公布日期 1983.12.15
申请号 JP19820098934 申请日期 1982.06.09
申请人 KOGYO GIJUTSUIN (JAPAN) 发明人 OOTA KIMIHIRO
分类号 G01N21/13;G01N21/25;G01N21/27 主分类号 G01N21/13
代理机构 代理人
主权项
地址