发明名称 Pattern analyzer
摘要 A pattern analyzer includes a sensor (19) for picking up an image of a pattern at a plurality of sampling points and for producing a shade signal representing the depth of shade at each sampling point. The sampled shade signals are temporarily stored in a memory (23) and, at the same time, are classified into different shade depths by a histogram forming circuit (30, 31, 32 and 33). The result of the classification is such that an amount of classified shade signals reaches a peak at two different shade depths. A threshold level determining circuit (34, 35, 36 and 37) is provided for determining a threshold level of shade depth between the two different shade depths. Also, a comparator (38, 39, 40 and 41) is provided for comparing the shade signals stored in the memory with the threshold level and for producing a 1-bit binary signal for each shade signal.
申请公布号 US4601057(A) 申请公布日期 1986.07.15
申请号 US19830559922 申请日期 1983.12.09
申请人 OMRON TATEISI ELECTRONICS CO. 发明人 TSUJI, SHUJI;ITO, HIROSHI;SAKA, KAZUHIKO
分类号 G06T1/00;G06K9/38;G06T5/40;G06T7/00;(IPC1-7):G06K9/38 主分类号 G06T1/00
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