METHOD OF DETERMINATION OF CRYSTALLOGRAPHIC INHOMOGENEITY OF SEMICONDUCTOR CRYSTALS,申请号SU19864052054-传众专利搜索

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发明名称	METHOD OF DETERMINATION OF CRYSTALLOGRAPHIC INHOMOGENEITY OF SEMICONDUCTOR CRYSTALS
摘要
申请公布号	RU1491271(C)	申请公布日期	1996.02.27
申请号	SU19864052054	申请日期	1986.04.07
申请人	INSTITUT FIZIKI AN BSSR;BPESTSKIJ INZHENEPNO-STPOITELNYJ INSTITUT	发明人	GLADYSHCHUK A.A.;GRIBKOVSKIJ V.P.;PARASHUK V.V.;YABLONSKIJ G.P.
分类号	H01L21/66;(IPC1-7):H01L21/66	主分类号	H01L21/66
代理机构		代理人
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地址

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