发明名称 Word line driver circuit for semiconducting memory component
摘要 The circuit has a line decoder (110) for generating a block selection signal and driving a main word line according to an address signal. A sub-word line trigger unit (120) generates a main decoding signal according to the address signal. A word decoder driver (130) buffers the main decoder signal and transfers it into a memory cell block. A block word decoder driver (140) triggers a sub-decoder signal in a corresponding block according to the block selection and main decoder signals. A sub-word line driver (150) drives a sub-word line according to the sub-decoder signal and drives the main word line via the line decoder.
申请公布号 DE19733396(A1) 申请公布日期 1998.03.26
申请号 DE19971033396 申请日期 1997.08.01
申请人 LG SEMICON CO. LTD., CHUNGCHEONGBUK-DO, KR 发明人 JEONG, JAE-HONG, SEOUL/SOUL, KR
分类号 G11C11/41;G11C8/10;G11C8/14;G11C11/401;G11C11/407;(IPC1-7):G11C7/00 主分类号 G11C11/41
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