发明名称 |
Method and apparatus for layout independent test point placement on a printed circuit board |
摘要 |
A layout independent test access point structure for accessing test points of a printed circuit board and method of fabrication thereof is presented. Each test access point structure is conductively connected to various locations along a trace at a test access point and above an exposed surface of the printed circuit board to be accessible for probing by a fixture probe.
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申请公布号 |
US7190157(B2) |
申请公布日期 |
2007.03.13 |
申请号 |
US20040972822 |
申请日期 |
2004.10.25 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
PARKER KENNETH P. |
分类号 |
G01R31/28;G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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