| 摘要 |
The invention concerns a method for analyzing an integrated circuit. The method includes, for a plurality of surface points of the integrated circuit, following steps: applying ( 102 ) a laser radiation, in one point of the surface of the integrated circuit; exciting ( 106 ) the circuit; collecting ( 108 ) the response of the circuit to the excitation; calculating ( 114 ) the propagation time intervening between the excitation time and the response-collecting time; and creating ( 116 ) an image of the integrated circuit showing a value representing the propagation time at each point of laser radiation application. The invention also concerns an installation for analyzing an integrated circuit.
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