发明名称 Oxide-based thin film transistor, method of fabricating the same, zinc oxide etchant, and a method of forming the same
摘要 Provided is a zinc (Zn) oxide-based thin film transistor that may include a gate, a gate insulating layer on the gate, a channel including zinc oxide and may be on a portion of the gate insulating layer, and a source and drain contacting respective sides of the channel. The zinc (Zn) oxide-based thin film transistor may further include a recession in the channel between the source and the drain, and a zinc oxide-based etchant may be used to form the recession.
申请公布号 US2008315193(A1) 申请公布日期 2008.12.25
申请号 US20080149409 申请日期 2008.05.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM CHANG-JUNG;PARK YOUNG-SOO;LEE EUN-HA;PARK JAE-CHUL
分类号 H01L29/22;C09K13/06;C09K13/08;H01L21/34 主分类号 H01L29/22
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