发明名称 SPUTTERING TARGET
摘要 PROBLEM TO BE SOLVED: To provide a sputtering target capable of preventing coarse clusters, such as particles, splashes and dust from occurring when a target is sputtered to improve the thickness uniformity of a thin film formed by sputtering.SOLUTION: The sputtering target using copper having a purity of 99.9 mass% or more as a principal component includes 10 ppm or less of sulfur (S) and 2 ppm or less lead (Pb). The purity of the copper is preferably 99.96 mass% or more.SELECTED DRAWING: Figure 1
申请公布号 JP2016156097(A) 申请公布日期 2016.09.01
申请号 JP20160104383 申请日期 2016.05.25
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 IN EITOKU;UEDA KENICHIRO;ANDO TOSHIYUKI
分类号 C23C14/34;H01L21/285 主分类号 C23C14/34
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