摘要 |
<p>The test circuit relates to the testing of circuit networks worh a number of signal inputs, especially for a rapid storage device, and which has at least one signal output. A signal combiner passes the input string to a smoothing circuit, and this is followed by a comparator to regulate the level of the signals for the "O" and "1" signal pulses. Following the comparator is an intermediate store which is connected with a digital comparator, and this is in turn regulated by pulse oscillator. Provision is made to extend the output circuit to accommodate a number of parallel data exit lines connected with the same control circuit.</p> |