发明名称 Test circuit for periodically monitoring the integrity of an antiskid brake control system
摘要 A test circuit periodically emits a test control signal as long as the vehicle speed exceeds a preselected value and there is no antiskid brake control action. The test signal causes a frequency control circuit to decrease the frequency of a sensor signal that indicates the rotating velocity of a wheel of the vehicle, thereby simulating a wheel deceleration sufficient to obtain wheel behavior signals from the antiskid brake control system. A logic sensing circuit then reacts to these wheel behavior signals to suppress production of an error signal, which otherwise occurs after a predetermined delay period to indicate a defect in the antiskid brake control system.
申请公布号 US4116494(A) 申请公布日期 1978.09.26
申请号 US19770839545 申请日期 1977.10.05
申请人 WABCO WESTINGHOUSE GMBH 发明人 GUDAT, WOLFGANG
分类号 G01M17/007;B60T8/1761;B60T8/90;G07C5/00;G08B23/00;(IPC1-7):B60T8/02 主分类号 G01M17/007
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