发明名称 TEST METHOD FOR STORAGE DEVICE
摘要 PURPOSE:To enable to test the address access time and address decoder function correctly, by repetitively making the data readout from the background address in ping-pong system while changing the reference address. CONSTITUTION:When the number of read times is set to the number of read time control circuit 1, the control circuit 4 gives the instruction signal to the mode control circuit 3 and the selector gate 6 and writes in the data D to all the addresses of the address counter 2-A. Next, the address (i) (reference address) is set to the address counter. Further, the data D is written in the address (i). The address i+1 is set to the counter 2-B to make n-time readout operation from the address i+1. Further, the readout of the address (i) of the counter 2-A is made and the counter 2-B is made to +1 and this is repeated. The circuit 4 receiving the signal in agreement with the content of the counters 2-A and 2-B from the comparison circuit 5-A, makes the counter 2-A by +1 and the entire processings are repeated.
申请公布号 JPS56153594(A) 申请公布日期 1981.11.27
申请号 JP19800057248 申请日期 1980.04.28
申请人 FUJITSU LTD 发明人 FURUKAWA YUUICHI
分类号 G11C29/10;G11C29/56 主分类号 G11C29/10
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